SSH Research seminar on Secondary Ion Mass Spectrometry Laboratory

SIMS is one of the most powerful characterization techniques for materials, chemistry, physics, and biology because of its unique capabilities to provide trace sensitivity (ppm to sub-ppb range) and excellent depth (as good as 1 nm) and lateral resolution (& lt; 1 µm for ion microscopes and 30 nm for ion microprobes). In particular, it has become an indispensable characterization technique in the fields of material, marine and biological science which require analytical techniques capable of probing small areas.