Secondary Ion Mass Spectrometry (SIMS)

The Secondary Ion Mass Spectrometer (SIMS) Cameca IMS 5FE7 determines the surface and near-surface composition in materials and detects elements ranging from hydrogen to uranium in parts per billion.


Potential SIMS applications include:

  • Depth profiling of semiconductor layers and interfaces
  • Segregation and diffusion studies in metals and ceramics 
  • Elemental mapping of materials surfacesIsotopic analysis of geological specimens 
  • Analysis of biological materials that can sustain ultra high vacuum

Industry Access

The SIMS facility can provide an analysis of samples tailored to commercial client requirements. Pricing is determined by a number of factors including:

  • Quantity of samples to be analysed
  • Analysis and report requirements
  • Expected frequency of analysis requirements
  • Time required to complete the analysis 
  • Publicly funded or commercial client

Research Access

Research access to the Secondary Ion Mass Spectrometer (SIMS) is available for both internal and external researchers.
The SIMS has many different fields of application, including:

  • Semiconductor Devices
  • Energy conversion components
  • Materials Science
  • Geology
    Biological materials that can sustain ultra high vacuum

Collaborative Research

Research in conjunction with external researchers is possible under a collaborative framework. Joint applications for ARC funding applications are encouraged. Please contact us for more information.

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